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Artifacts in Atomic Force Microscopy of Nanoporous and Mesoporous Fiducial Samples

Published online by Cambridge University Press:  15 February 2011

H. W. Deckman and
R. J. Plano
H. W. Deckman
Affiliation:
Corporate Research, Exxon Research & Engineering Co., Annandale, N.J.
R. J. Plano
Affiliation:
Corporate Research, Exxon Research & Engineering Co., Annandale, N.J.
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Abstract

Artifacts dominate atomic force microscope (AFM) images of nanoporous and mesoporous inorganic oxide materials taken under ambient atmospheric conditions with currently available tips. Artifacts in these AFM images are attributed to tip-sample interactions and the sharpness of tips on currently available cantilevers. We show that by modifying currently available AFM tips with carbonaceous materials, many image artifacts are eliminated. To characterize image artifacts, a variety of fiducial samples with feature sizes between ∼100 Å and 2,000 Å are used. One of the most useful fiducial samples is a close packed array of holes in a commercially available alumina membrane and we suggest that it be adopted as a standard fiducial sample.

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