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Auger Electron and Photoelectron Diffraction in Magnetic Thin Films

Published online by Cambridge University Press:  03 September 2012

Y.U. Idzerda and
D.E. Ramaker
Y.U. Idzerda
Affiliation:
Naval Research Laboratory, Washington, D.C. 20375
D.E. Ramaker
Affiliation:
Naval Research Laboratory, Washington, D.C. 20375Dept. of Chemistry, George Washington University, Washington, D.C. 20052
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Abstract

The role of the final-state character of the emitted electron in Auger electron diffraction (AED) and x-ray photoelectron diffraction (XPD) is examined with respect to magnetic materials. Single scattering cluster calculations with the inclusion of the spherical wave character and the final-state character of the emitted electron (both angular momentum quantum number and magnetic quantum number) show that selective emission from different M-levels, generated by a non-statistical distribution of initial M-levels or by an M-selective excitation process, results in distinctly different emission patterns.

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