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Basic Concepts in Electromigration

Published online by Cambridge University Press:  15 February 2011

Richard S. Sorbello
Richard S. Sorbello*
Affiliation:
Department of Physics, University of Wisconsin-Milwaukee, Milwaukee, WI 53201
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Abstract

A review of basic concepts in electromigration is presented and recent theoretical developments are discussed. The microscopic origin of the driving force for electromigration is elucidated and, as an example, the driving force exerted on an impurity near a grain boundary is calculated in a jellium model. A connection is made between the calculated electromigration driving force and 1/f-noise measurements. Results of the first computer simulations of electromigration at the microscopic level are presented. It is found that dynamical recoil effects can lead to a significant enhancement of electromigration for light interstitial impurities.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 225: Symposium G – Materials Reliability Issues in Microelectronics , 1991 , 3
Copyright
Copyright © Materials Research Society 1991

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References

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