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Capillary Instabilities in Thin, Polycrystalline Films

Published online by Cambridge University Press:  22 February 2011

David J. Srolovitz and
S. A. Safran
David J. Srolovitz
Affiliation:
Los Alamos National Laboratory Los Alamos, NM 87545
S. A. Safran
Affiliation:
Exxon Research and Engineering Annandale, NJ 08801
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Abstract

Thin films can break up into islands only if they are perturbed by substrate-intersecting perturbations. Grain boundary grooves and vertex pits are typical defects which nucleate holes in these films. Holes which exceed a critical size - proportional to the ratio of the film thickness to the equilibrium contact angle - grow, eventually disconnecting the film.

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References

REFERENCES

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