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Characterization of Interfaces Between Polymers and Metals by Static SIMS

Published online by Cambridge University Press:  21 February 2011

W.J. Van Ooij
W.J. Van Ooij*
Affiliation:
Dept. of Chemistry and Geochemistry, Colorado School of Mines, Golden, CO 80401
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Abstract

The use of static Secondary Ion Mass Spectrometry (SIMS) in the characterization of polymer surfaces and interfaces between polymers and metals is described. Examples are given of the use of SIMS to study the effects of plasma treatments on polyimide surfaces and for the analysis of the interface in metallized polytetrafluoroethylene (PTFE).

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 154: Symposium K – Electronic Packaging Materials Science IV , 1989, 233
Copyright
Copyright © Materials Research Society 1989

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References

1. Ooij, W.J. van and Brinkhuis, R.H.G., Surf. Interface Anal., 11, 430 (1988).Google Scholar
2. Ooij, W.J. van and Brinkhuis, R.H.G., in Secondary Ion Mass Spectrometry, SIMS VI, edited by Benninghoven, A., Huber, A.M. and Werner, H.W. (John Wiley & Sons, New York, 1988) p.635.Google Scholar
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6. ooij, W.J. van, presented at the Industry-University Advanced Materials Conference, Denver, CO, March 6–9, 1989. Accepted for publication in the Proceedings.Google Scholar
7. Ooij, W.J. van, presented at the Symposium on Metallized Plastics at the 174th Meeting of the Electrochemical Society, Chicago, IL, October 9–14, 1988. Accepted for publication in the Proceedings.Google Scholar