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The CM30-SuperTWIN: A Dedicated Ultra-High Resolution Transmission Electron Microscope

Published online by Cambridge University Press:  21 February 2011

Max T. Otten
Max T. Otten*
Affiliation:
Philips Analytical, Electron Optics Application Laboratory, Building AAE, 5600 MD Eindhoven, The Netherlands
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Abstract

The CM30-Super TWIN Transmission Electron Microscope achieves a point resolution of 0.19 nm as shown by standard and Young's fringes diffractograms. Thanks to its unique TWIN lens concept, the instrument combines ultra-high resolution with excellent performance in numerous other operational modes, including scanning, diffraction and micro-analysis. Coma-free alignment, providing accurate objective-lens centring, is standard on the CM30. Complete microprocessor control yields ease of operation, accurate and reproducible microscope control and connection with peripheral equipment.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989, 251
Copyright
Copyright © Materials Research Society 1989

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References

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