Hostname: page-component-7b7567c8c-tnzcf Total loading time: 0 Render date: 2026-11-14T12:18:45.551Z Has data issue: false hasContentIssue false
  • English
  • Français

Computer Models of Rapid Solidification

Published online by Cambridge University Press:  21 February 2011

G. H. Gilmer and
J. Q. Broughton
G. H. Gilmer
Affiliation:
Bell Laboratories, Murray Hill, New Jersey 07974
Get access

Abstract

We discuss some recent simulations of crystal growth from the melt at large values of the undercooling. Molecular dynamics studies of the crystallization of a Lennard-Jones liquid and Monte Carlo simulations of the Ising model have together provided information on several aspects, including maximum growth rates, generation of vacancies and other defects, and impurity trapping.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 21: Symposium GREECE – Phase Transformations in Solids , 1983, 443
Copyright
Copyright © Materials Research Society 1984

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

(1) “Laser and Electron Beam Interactions with Solids,” Appleton and, B. R. Celler, G. K., eds. (Elsevier, Amsterdam, 1982).Google Scholar
(2) Poate, J. M., “Laser and Electron Beam Interactions with Solids,” (Elsevier, Amsterdam, 1982), p. 121.Google Scholar
(3) Broughton, J. Q., Gilmer, G. H. and Jackson, K. A., Phys. Rev. Lett. 49, 1496 (1982).Google Scholar
(4) Gilmer, G. H. and Jackson, K. A., in: “Crystal Growth and Materials,” Kaldis, E. and Scheel, H. J., eds. (North-Holland, Amsterdam, 1977), p. 79.Google Scholar
(5) Gilmer, G. H., in: “Laser-Solid Interactions,” Narayan, R., Brown, W. L. and Lemons, R. A., eds. (North-Holland, Amsterdam, 1983), p. 249.Google Scholar
(6) Recent reviews include: van der Eerden, J. P., Bennema, P., and Cherepanova, T. A., in: “Progress in Crystal Growth and Characterization,” Pamplin, B. R., ed. (Pergamon, Oxford, 1979) vol. 3, p. 219;Google Scholar
6a Weeks, J. D. and Gilmer, G. H., Adv. Chem. Phys. 40, 157 (1979).Google Scholar
(7) Landman, U., Cleveland, C. L. and Brown, C. S., Phys. Rev. Lett. 45, 2032 (1980).Google Scholar
(8) Tully, J. C., Gilmer, G. H. and Shugard, M., J. Chem. Phys. 71, 1630 (1979).Google Scholar
(9) All units are related to the well depth ∈ and length parameter σ in the LJ potential φ, where r is the distance between particles.Google Scholar
(10) Colligan, G. A. and Bayles, B. J., Acta. Met. 10, 895 (1962).Google Scholar
(11) See, for example; Vergano, P. J. and Uhlmann, D. R., in: “Reactivity of Solids,” Mitchell, J. W., ed. (Wiley, N.Y., 1969).Google Scholar
(12) Frenkel, J., Phys. Z. Sowjetunion I, 498 (1932).Google Scholar
(13) Kristensen, W. D., J. Non-Cryst. Solids 21, 303 (1976).Google Scholar
(14) Turnbull, D. and Bagley, B. G., in: “Treatise on Solid State Chemistry,” Hannay, N. B., ed. (Plenum, New York, 1975), Vol. 5, p. 526.Google Scholar
(15) Broughton, J. Q., Bonissent, A., and Abraham, F. F., J. Chem. Phys. 74, 4029 (1981).Google Scholar
(16) den Broeder, F. J. A., Acta. Metall. 20, 319 (1972).Google Scholar
(17) Zeiger, H. J., Fan, J. C. C., Palm, B. J., Gale, R. P., and Chapman, R. L., in: “Laser and Electron Beam Processing of Materials,” White, C. W. and Peercy, P. S., eds. (Academic Press, New York, 1980) p. 221;Google Scholar
(17a). Gilmer, G. H. and Leamy, H. J., in: “Laser and Electron Beam Processing of Materials,” White, C. W. and Peercy, P. S., eds. (Academic Press, New York, 1980)., p. 227;Google Scholar
(17b) Leamy, H. J., Brown, W. L., Celler, G. K., Foti, G., Gilmer, G. H., and Fan, J. C. C., in: ”Laser and Electron Beam Solid Interactions and Materials Processing,” Hess, Gibbons, and Sigmon, , eds. (Elsevier, Amsterdam, 1981).Google Scholar
(18) Burton, J..A., Prim, R. C. and Slichter, W. P., J. Chem. Phys. 21, 1987 (1953).Google Scholar
(19) Poate, J. M., in: Ref. 1, p. 121; Baeri, P., Foti, G., Poate, J. M., Campisano, S. U., and Cullis, A. G., Appl. Phys. Lett. 38, 800 (1981).Google Scholar
(20) Wood, R. F., Phys. Rev. B 25, 2786 (1982).Google Scholar
(21) Broughton, J. Q. and Gilmer, G. H., unpublished; also see Ref. 15.Google Scholar