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Correlation Between Electrical Properties and Composition / Microstructure of Si-C-N Ceramics

Published online by Cambridge University Press:  10 February 2011

C. Haluschka,
C. Engel,
R. Riedel,
H.-J. Kleebe and
R. Franke
C. Haluschka
Affiliation:
Technische Universität Darmstadt, Fachbereich Materialwissenschaft, Fachgebiet Disperse Feststoffe, Darmstadt, Germany
C. Engel
Affiliation:
Technische Universität Darmstadt, Fachbereich Materialwissenschaft, Fachgebiet Disperse Feststoffe, Darmstadt, Germany
R. Riedel
Affiliation:
Technische Universität Darmstadt, Fachbereich Materialwissenschaft, Fachgebiet Disperse Feststoffe, Darmstadt, Germany
H.-J. Kleebe
Affiliation:
Universität Bayreuth, Institut für Materialforschung, Bayreuth, Germany
R. Franke
Affiliation:
Universität Bonn, Physikalisches Institut, Bonn, Germany
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Abstract

In this paper we report on the measurement of electrical properties of multielement ceramics in the ternary Si-C-N system using the impedance spectroscopy. The results were correlated to the chemical composition, the hybridization state and the microstructural characteristics investigated by chemical analysis, X-Ray absorption near edge spectroscopy (XANES), Raman Spectroscopy, high resolution transmission electron microscopy (HRTEM) and X-Ray powder diffraction (XRD).

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References

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