Hostname: page-component-6898cfcb55-w5hgh Total loading time: 0 Render date: 2026-11-11T19:08:18.351Z Has data issue: false hasContentIssue false
  • English
  • Français

Defects in Materials: Their Characterization and Simulation.

Published online by Cambridge University Press:  26 February 2011

Colin G. Windsor
Colin G. Windsor*
Affiliation:
National Non-Destructive Testing Centre, AEA Technology, B521.2, Harwell Laboratory, OXlI ORA, UK.
Get access

Abstract

Materials research does not necessarily need to eliminate defects, but rather to characterize them, and to understand and control their effects. In most cases chacterization of defects means making structural or dynamic measurements of their properties. To understand these measurements in order to predict material and defect properties outside the range of the measurements is a much harder problem. Ideally a theory is required. However in the materials examples considered in this review, point defects in uranium oxide, copper clusters in steel, grain boundary aggregations, and stress concentrations, a true analytic theory is beyond our capabilities. Here computer modelling is often able to make the progress needed. This review considers the complementary nature of experimental characterization and computer simulation in our understanding of defects in materials.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 209: Symposium K – Defects in Materials , 1990, 3
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1. Willis, B. T. M. Proc. Br. Ceram. Soc. 1, 9 (1964).Google Scholar
2. Lidiard, A. B. and Norgett, M. J. “Computational Solid State Physics” (eds Herman, F, Dalton, N W and Koehler, T. R.) p 385, Plenum Press (1972).CrossRefGoogle Scholar
3. Catlow, C. R. A., Proc. Roy. Soc. Lond., A253, 533 (1977).Google Scholar
4. Goff, J. P., Hutchings, M. T., Brown, K., Hayes, W. and Godfrin, H., MRS Proceedings, Boston (1989).Google Scholar
5. Hull, S., Goff, J. P., Hutchings, M. T. and Hayes, W., ISIS,Experimental Report, unpublished, (1990).Google Scholar
6. Goff, J. P., Hull, S., Hutchings, M. T. and Hayes, W., ISIS Experimental Report, unpublished, (1990).Google Scholar
7. Buswell, J. T., English, C. A., Hetherington, M. G., Pythian, W. J., Smith, G. D. W., and Worrall, G M, “Effects of Radiation on Materials: 14th International Symposium (Vol II), ASTM STP 1046, 127, (1990).Google Scholar
8. Phythian, W. J., Foreman, A. J., English, C. A., Buswell, J. T., Hetherington, M., Roberts, K. and Pizzini, S., AEA-TRS-2004, to be published, (1990).Google Scholar
9. Ackland, G. J., Finnis, M. W., Tichy, G. and Vitak, V., Phil Mag., 56, 735 (1987).Google Scholar
10. Riviere, J. C., “Surface Analytical Techniques”, Oxford University Press (1990).CrossRefGoogle Scholar
11. Penfold, J., Chapter 16 in “Neutron Scattering at a Pulsed Source”, Ed. Newport, R. J., Rainford, B.D., and Cywinski, R, Adam Hilger, Bristol (1988).Google Scholar
12. Burgess, A. N., Non Destruct. Test. and Eval. (to be published) 1990.Google Scholar
13. Duffy, D. M. and Tasker, P. W., Phil Mag. A 47, 817, (1983).Google Scholar
14. Hawick, K. and Windsor, C. G., Unpublished (1990).Google Scholar
15. Allen, A. J., Hutchings, M.T., Windsor, C. G., and Andreani, C., Adv Phys. 34, 445, (1985).Google Scholar
16. Allen, A. J., Hutchings, M.T., and Rainey, V. S., “Non-Destructive Testing”, Proceeding of the 14th Conference, London, p 1808, Pegamon Press (1987).Google Scholar