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Dislocation Image Stresses at Free Surfaces by the Finite Element Method

Published online by Cambridge University Press:  01 February 2011

Meijie Tang,
Guanshui Xu,
Wei Cai and
Vasily Bulatov
Meijie Tang
Affiliation:
Lawrence Livermore National Laboratory, P. O. Box 808, Livermore, CA 94551
Guanshui Xu
Affiliation:
Lawrence Livermore National Laboratory, P. O. Box 808, Livermore, CA 94551
Wei Cai
Affiliation:
Lawrence Livermore National Laboratory, P. O. Box 808, Livermore, CA 94551
Vasily Bulatov
Affiliation:
Lawrence Livermore National Laboratory, P. O. Box 808, Livermore, CA 94551
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Abstract

The finite element method has been routinely used to calculate the image stresses of dislocation segments. When these segments intersect with surfaces, the image stresses at the surfaces diverge singularly. At the presence of these singularities, both convergence and accuracy of using the finite element method need to be examined critically. This article addresses these issues with the aim toward the application of dislocation dynamics simulations in thin films.

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References

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