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Dislocations, Steps and Interphase Boundary Migration

Published online by Cambridge University Press:  21 February 2011

D.A. Smith
D.A. Smith*
Affiliation:
Ibm T.J. Watson Research Center, P.O. Box 218, Yorktown Heights, N.Y. 10598
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Abstract

Interface migration is the fundamental process in numerous phase transformations. For those which are thermally activated the basic event is addition of atoms to a defect in an interface. Interfacial defects can have a range of topographic and elastic characteristics which complicates investigations by transmission electron microscopy, it is difficult to make quantitative in-situstudies of interface migration because of problems of resolution and control of driving forces in specimens where surface effects dominate.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 31: Symposium N – Electron Microscopy of Materials , 1983 , 223
Copyright
Copyright © Materials Research Society 2006

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References

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