Hostname: page-component-7b7567c8c-2n9c9 Total loading time: 0 Render date: 2026-11-14T23:02:58.159Z Has data issue: false hasContentIssue false
  • English
  • Français

Dynamic TEM Observation on Oxide Glass Materials

Published online by Cambridge University Press:  21 February 2011

Sumio Iijima
Sumio Iijima*
Affiliation:
NEC Corporation, Fundamental Research Laboratories, 34, Miyukigaoka, Tsukuba 305, Japan
Get access

Abstract

Intensity fluctuation in high resolution electron microscope (HREM) images of amorphous Tl-Ba-Ca-Cu-O oxide films is observed. The fluctuation with a frequency of few tens of Hertz and an amplitude of about 0.3nm, occurs under an intense electron beam irradiation. It is shown experimentally that atom migration in the films is responsible for the fluctuations. The result is also supported by computer image simulations on a model structure for amorphous film.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Cowley, J.M., in Diffraction Physics, (North-Holland, 1975).Google Scholar
2. Iijima, S., J. Microscopy. 119, 99 (1980).Google Scholar
3. Iijima, S., Ichihashi, T., Shimakawa, Y., Manako, T. and Kubo, Y., Jpn. J. Appl. Phys. 27, L1054 (1988).Google Scholar
4. Iijima, S. and Ichihashi, T., Jpn. J. Appl. Phys. 24, L125 (1985).Google Scholar
5. Tagayanagi, K., Mitome, M. and Tanishiro, Y., Jpn. J. Appl. Phys. 26, L957 (1987).Google Scholar
6. Iijima, S., Surface Science. 156, 1003 (1985).Google Scholar
7. Iijima, S., Chemica Scripta. 14, 1117 (1978–9).Google Scholar
8. Iijima, S., Optik. 48, 193 (1977).Google Scholar
9. Iijima, S. and Ichihashi, T., Phy. Rev. Lett. 56, 616 (1986).Google Scholar
10. Ijiima, S., in Microclusters edited by Sugano, et al. (Springer-Verlag. Berlin, 1987). p. 186.Google Scholar