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Entropy of Atomic Hopping in Diffusion and Defect Transformations

Published online by Cambridge University Press:  28 February 2011

T.W. Dobson,
J.F. Wager and
J. A. VAN Vechten
T.W. Dobson
Affiliation:
Tektronix, Inc., Beaverton, OR 97077
J.F. Wager
Affiliation:
Department of Electrical and Computer Engineering, Center for Advanced Materials Research, Oregon State University, Corvallis, Oregon 97331
J. A. VAN Vechten
Affiliation:
Department of Electrical and Computer Engineering, Center for Advanced Materials Research, Oregon State University, Corvallis, Oregon 97331
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Abstract

A formulation for the entropy of vacancy migration based on the ballistic model is proposed and applied quantitatively to explain activation entropies which were previously considered abnormal.

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