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The Evolution of Titanium-Silicon Interfaces as Monitored by X-Ray Diffraction

Published online by Cambridge University Press:  25 February 2011

Thomas Novet,
John McConnell and
David C. Johnson
Thomas Novet
Affiliation:
University of Oregon, Department of Chemistry and Materials Science Institute Eugene, Oregon 97403
John McConnell
Affiliation:
University of Oregon, Department of Chemistry and Materials Science Institute Eugene, Oregon 97403
David C. Johnson
Affiliation:
University of Oregon, Department of Chemistry and Materials Science Institute Eugene, Oregon 97403
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Abstract

Reactions in solids occur at interfaces. Following interfacial reactions has been difficult due to the small fraction of material making up the interfaces. In this paper, variable-temperature grazing x-ray diffraction is used to probe interfacial reactions in modulated ultra-thin film layered composites. This technique permits the monitoring of solid-state reactions in their earliest stages. The initial evolution of titanium-silicon interfaces within a superlattice is discussed. Our data suggest that the classical approach of modeling diffusion via Fick's laws is insufficient to describe the initial interdiffusion or mixing reaction at an interface.

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References

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