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Exafs Studies of Multilayer Interfaces

Published online by Cambridge University Press:  21 February 2011

S. M. Heald and
G. M. Lamble
S. M. Heald
Affiliation:
Brookhaven Laboratory, Upton, NY 11973, USA
G. M. Lamble
Affiliation:
Brookhaven Laboratory, Upton, NY 11973, USA
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Abstract

Important for the understanding of multilayer materials is a determination of their interface structure. The extended x-ray absorption fine structure (EXAFS) technique can be useful, particularly for interfaces with a high degree of structural disorder. This paper reviews the application of EXAFS to multilayers, and describes the standing wave enhancement of the EXAFS from multilayer interfaces. Examples are given for W-C and Ni- Ti multilayers.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 143: Symposium V – Synchrotron Radiation in Materials Research , 1988, 133
Copyright
Copyright © Materials Research Society 1989

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References

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