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Grain Boundary Transformations in Bi-Doped Copper

Published online by Cambridge University Press:  25 February 2011

Elsie C. Urdaneta,
David E. Luzzi and
Charles J. McMahon Jr
Elsie C. Urdaneta
Affiliation:
University of Pennsylvania, Department of Materials Science and Engineering, Philadelphia, PA 19104
David E. Luzzi
Affiliation:
University of Pennsylvania, Department of Materials Science and Engineering, Philadelphia, PA 19104
Charles J. McMahon Jr
Affiliation:
University of Pennsylvania, Department of Materials Science and Engineering, Philadelphia, PA 19104
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Abstract

Bismuth-induced grain boundary faceting in Cu-12 at ppm Bi polycrystals was studied using transmission electron microscopy (TEM). The population of faceted grain boundaries in samples aged at 600°C was observed to increase with heat treatment time from 15min to 24h; aging for 72h resulted in de-faceting, presumably due to loss of Bi from the specimen. The majority of completely faceted boundaries were found between grains with misorientation Σ=3. About 65% of the facets of these boundaries were found to lie parallel to crystal plane pairs of the type {111}1/{111]2- The significance of these findings in light of recent high resolution electron microscopy experiments is discussed.

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References

REFERENCES

1. Balluffi, R. W. in Interfacial Segregation, edited by Johnson, W.C. and Blackely, J.M. (ASM, Metals Park, Ohio, 1977) p. 193 Google Scholar
2. Henry, G., Plateau, J., Wache, X., Gerber, M., Behar, I. and Crussard, C., Mem. Sci. Rev. Met. 56, 417 (1959)Google Scholar
3. Rellick, J. R., McMahon, C. J. Jr, Marcus, H. L. and Palmberg, P. W., Met. Trans. 2, 1492 (1971)Google Scholar
4. Pichard, C., Rieu, J. and Goux, C., Mem. Sci. Rev. Met. 70, 13 (1973)Google Scholar
5. Donald, A. M. and Brown, L. M., Acta Metall. 27, 59 (1979)Google Scholar
6. Cahn, J. W., J. Physique 43 (12), C6–199 (1982)Google Scholar
7. Ference, T. G. and Balluffi, R. W., Scripta Metall. 22, 1929 (1989)Google Scholar
8. Menyhard, M., Blum, B., McMahon, C. J. Jr, Acta Metall. 37, 549 (1989)Google Scholar
9. Blum, B., Menyhard, M., Luzzi, D. E. and McMahon, C. J. Jr, Scripta Metall. et Mater. 24 (11), 2169(1990)CrossRefGoogle Scholar
10. Luzzi, D. E., Ultramicroscopy 37, 180, (1991)Google Scholar
11. Stein, D. F. and Heldt, L. A. in Interfacial Segregation, edited by Johnson, W. C. and Blackely, J. M. (ASM, Metals Park, Ohio, 1977) p.239 Google Scholar
12. Goodhew, P. J. in Grain Boundary Structure and Kinetics (ASM, Metals Park, Ohio, 1979), p.155 Google Scholar
13. Luzzi, D. E., Yan, Min, Šob, M. and Vitek, V., Phys. Rev. Lett. 67 (14), 1894 (1991)Google Scholar