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High Resolution Electron Microscopy Observations About The Interface Structure In A Ti/TiN Multilayer Material

Published online by Cambridge University Press:  25 February 2011

X. G. Ning,
L. P. Guo,
R. F. Huang,
J. Gong,
B. H. Yu,
L. S. Wen and
H. Q. Ye
X. G. Ning
Affiliation:
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, China
L. P. Guo
Affiliation:
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, China
R. F. Huang
Affiliation:
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, China
J. Gong
Affiliation:
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, China
B. H. Yu
Affiliation:
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, China
L. S. Wen
Affiliation:
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, China
H. Q. Ye
Affiliation:
Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, China
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Abstract

The interface structure in a Ti/TiN multilayer material has been investigated by high resolution transmission electron microscopy (HRTEM). It was shown that the α-Ti and β-TiN layers consisted of many cylindrical crystals growing along the close packed directions normal to the surface of a stainless steel. There existed specific orientation relationship at the Ti/TiN interfaces without transition layers: (111)TiN ‖ (001)Ti, [110]TiN ‖ [100]Ti. However there was no such orientation relationship at the Ti/TiN interfaces with TixN (x >1) transition layers.

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References

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