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High Spatial Resolution Microanalysis of Catalyst Particles

Published online by Cambridge University Press:  25 February 2011

C. E. Lyman
C. E. Lyman*
Affiliation:
Lehigh University, Department of Metallurgy and Materials Engineering, Whitaker Lab #5, Bethlehem, Pennsylvania 18015
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Abstract

Qualitative and quantitative analysis of small catalyst particles is possible in the analytical electron microscope down to analysis areas on the order of 10 nm in diameter. The location of elements in the image field can be determined either by placing the electron probe on a particu-lar image feature or by forming a digital x-ray image showing the distribu-tion of various elements. In either case analysis of specimens of well defined thickness such as microtomed thin sections preserves spatial relationships in catalyst particles and simplifies interpretation of single element x-ray images. Electron energy loss spectroscopy can be combined with x-ray spectroscopy to reduce the ambiguity in x-ray spectra caused by spurious x-rays generated by electrons scattered from the analy-sis area to regions of high concentrations of elements removed from the analysis area.

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References

1. Turkevich, J., J. Chem. Phys. 13, 235 (1945).Google Scholar
2. Baker, R. T. K., Catal. Rev. Sci. Eng. 19, 161 (1979).Google Scholar
3. Mustard, D. G., Bartholomew, C. H., J. Catal. 67, 186 (1981).Google Scholar
4. Harris, P. J. F., Boyes, E. D., Cairns, J. A., J Catal. 82, 127 (1983).Google Scholar
5. Pennycook, S. J., Howie, A., Shannon, M. D., Whyman, R., J. Molec. Catal. 20, 345 (1983).Google Scholar
6. Targos, W. M., Analytical Electron Microscopy 1984, edited by Williams, D. B. and Joy, D. C. (San Francisco Press), p. 201.Google Scholar
7. Datye, A. K., Allard, L. F., Schwank, Johannes, Analytical Electron Microscopy 1984, edited by Williams, D. B. and Joy, D. C. (San Francisco Press), p. 205.Google Scholar
8. Delannay, F., Cat. Rev. Sci. Eng. 22, 141 (1980)Google Scholar
9. Mehta, S., Simmons, G. W., Klier, K., Herman, R. G., J. Catal. 57, 339 (1979).Google Scholar
10. Dexpert, H., Freund, E., Lynch, J. in Quantitative Microanalysis with High Spatial Resolution, edited by Lorimer, G. W., Jacobs, M. H., Doig, P., (The Metals Society, London, 1981) p. 101.Google Scholar
11. Howie, A., Marks, L. D., Pennycook, S. J., Ultramicroscopy 8, 163 (1982)Google Scholar
12. Schabes-Retchkiman, P., Gomez, A., Yacaman, M. J., Ocana, T., Proc. Electron Microscopy Society of America, edited by Bailey, G. W. (Claitor's Publishing, Baton Rouge, 1982), p. 666.Google Scholar
13. Lyman, C. E., J. Molec. Catal. 20, 357 (1983).Google Scholar
14. Dominquez, J. M., Simmons, G. W., Klier, K., J. Molec. Catal. 20, 369 (1983).Google Scholar
15. Cowley, J. M., Monosmith, W. B., Proc. Electron Microscopy Society of America, edited by Bailey, G. W. (San Francisco Press, 1983), p. 332.Google Scholar
16. Goldstein, J. I., Costley, J. L., Lorimer, G. W., Reed, S. J. B., Scanning Electron Microscopy/1977, Vol. I, edited by Johari, O., IIT Res. Inst., Chicago, p. 315.Google Scholar
17. Steeds, J. W., in Introduction to Analytical Electron Microscopy edited by Hren, J. J., Goldstein, J. I., Joy, D. C. (Plenum Press, New York, 1979) p. 387.Google Scholar
18. Cliff, G., Lorimer, G. W., J. Microsc. 103, 203 (1975).Google Scholar
19. Wood, J. E., Williams, D. B., Goldstein, J. I., J. Microsc. 133, 255 (1984).CrossRefGoogle Scholar
20. Nicholson, W. A. P., Gray, C. C., Chapman, J. N., Robertson, B. W., J. Microsc. 125, 25 (1982).Google Scholar
21. Ziebold, T. O. Anal. Chem. 39, 858 (1967).Google Scholar
22. Williams, D. B., Practical Analytical Electron Microscopy in Materials Science, (Verlag-Chemie Intl., Deerfield Beach, FL, 1984), pp. 1–155.Google Scholar
23. Egerton, R. F., Phil. Mag. 31, 199 (1975).Google Scholar
24. Shuman, H., Ultramicroscopy 6, 163 (1981).Google Scholar
25. Cosslett, V. E., Duncumb, P., Nature 177, 1172 (1956).CrossRefGoogle Scholar
26. Lyman, C. E., Proc. Electron Microscopy Society of America, edited by Bailey, G. W. (San Francisco Press, 1984), p. 654.Google Scholar
27. Treacy, M. M. J., Howie, A., Wilson, C. J., Phil. Mag. A 38, 569 (1978).Google Scholar
28. Butler, J. H., Proc. Electron Microscopy Society of America, edited by Bailey, G. W. (Claitor's Publishing, Baton Rouge, 1981), p. 136.Google Scholar
29. Lyman, C. E., Ferretti, A., Long, N. J., Analytical Electron Microscopy 1984, edited by Williams, D. B. and Joy, D. C. (San Francisco Press), p. 209.Google Scholar
30. Argauer, R. J. and Landolt, G. R., U.S. Patent 3,702,886 (1972).Google Scholar
31. Breck, D. W., U.S. Patent 3,130,007 (1964).Google Scholar
32. von Ballmoos, R. and Meier, W. M., Nature 389, 782 (1981).Google Scholar