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High Speed Infrared Detectors Using Y-Ba-Cu-O Thin Films

Published online by Cambridge University Press:  28 February 2011

J.P. Zheng,
Q.Y. Ying and
H.S. Kwok
J.P. Zheng
Affiliation:
Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Amherst, NY 14260
Q.Y. Ying
Affiliation:
Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Amherst, NY 14260
H.S. Kwok
Affiliation:
Institute on Superconductivity, State University of New York at Buffalo, Bonner Hall, Amherst, NY 14260
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Abstract

Y-Ba-Cu-O thin films were used for CO2 laser detection. Operation of the Y-Ba-Cu-O detector in both the bolometric and nonbolometric modes were studied. It was found that the detectivity of the superconducting detector was competitive with conventional detectors. The speed was within the instrument resolution of 10 ns. The superconducting film quality is critical to the performance of these detectors.

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References

1 Rose, K., Bertin, C.L. and Katz, R.M., p. 267 in Applied Superconductivity, ed. by Newhouse, V.L., Academic Press, New York 1975.Google Scholar
2 Zheng, J.P., Ying, Q.Y., Kwok, H.S. and Rao, R., Appl. Phys. Lett., 54, 2473 (1989).Google Scholar
3 Frenkel, A., Saifi, M.A., Venkatesan, T., Lin, C.L., Wu, Y.D. and Inam, A., Appl. Phys. Lett., 54, 1594 (1989).Google Scholar
4 Leung, M., Broussard, P.R., Claassen, J.H., Osofsky, M., Wolf, S.A. and Strom, U., Appl. Phys. Lett., 51, 2046 (1987).Google Scholar
5 Forrester, M.G., Gottlieb, M., Gavaler, J.R. and Braginski, A.I., Appl. Phys. Lett. 54, 1332 (1988).Google Scholar
6 Enomoto, Y., Murakami, T. and Suzuki, M., Physica C 153–155, 1592 (1988).Google Scholar
7 Zeldov, E., Amer, N.M., Koren, G. and Gupta, A., Phys. Rev. B39, 9712, 1989.Google Scholar
8 Brocklesby, W.S., Monroe, D., Levi, A.F.J., Hong, M., Liou, S.H., Kwo, J. and Rice, C.E., Appl. Phys. Lett. 54, 1175 (1989).Google Scholar
9 Culbertson, J.C., Strom, U., Wolf, S.A., Skeath, P., West, E.J. and Burns, W.K., Phys. Rev. B39, 12359, 1989.Google Scholar
10 Donaldson, W.R., Kadin, A.M., Ballantine, P.H. and Sobelowski, R., Appl. Phys. Lett. 54, 2470 (1989).Google Scholar
11 Witanachchi, S., Patel, S., Kwok, H.S. and Shaw, D.T., Appl. Phys. Lett., 54, 578 (1989).Google Scholar
12 Zheng, J.P., Ying, Q.Y., Kim, H.S., Bush, P., Barone, R., Shaw, D.T., and Kwok, H.S., Appl. Phys. Lett. 55, 1044 (1989).Google Scholar
13 Kwok, H.S. and Yablonovitch, E., Appl. Phys. Lett., 27, 583 (1975).Google Scholar
14 Enomoto, Y. and Murakami, T., J. Appl. Phys. 59, 3808 (1986).Google Scholar
15 Dykaar, D.R., Sobelowski, R., Hsiang, T.Y. and Mourou, G.A., IEEE Trans. Mag. MAG–23, 767 (1987).Google Scholar