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Image Processing To Aid in Graphene Detection

Published online by Cambridge University Press:  24 October 2014

Ryan D. Gorby and
Lihong (Heidi) Jiao
Ryan D. Gorby
Affiliation:
School of Engineering, Grand Valley State University, Grand Rapids, MI 49504, U.S.A.
Lihong (Heidi) Jiao
Affiliation:
School of Engineering, Grand Valley State University, Grand Rapids, MI 49504, U.S.A.
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Abstract

Qualitative techniques for the detection of graphene on a Si/SiO2 substrate, without the use of sophisticated equipment, are presented. Once calibrated, this technique can be used to detect Single Layer Graphene (SLG) and Few Layer Graphene (FLG) with the use of an inexpensive optical microscope (OM), OM camera system, and image processing software. This technique could be transferred to graphene deposited on other substrates or other 2-D materials with minor updates to mathematical theory.

Keywords

nanostructurelayeredoptical properties

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Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1702: Symposium OO – De Novo Graphene , 2014, mrss14-1702-oo15-05
Copyright
Copyright © Materials Research Society 2014 

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References

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