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Junction Field Effect Transistor X-RAY Detectors

Published online by Cambridge University Press:  21 February 2011

J.C. Lund,
F. Olschner and
L. Rehn
J.C. Lund
Affiliation:
RMD, Inc. 44 Hunt St., Watertown, MA 02172
F. Olschner
Affiliation:
RMD, Inc. 44 Hunt St., Watertown, MA 02172
L. Rehn
Affiliation:
InterFET Scientific, 322 Gold St., Garland, TX 75042
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Abstract

We describe the theory of operation, design, and estimated performance of an n-channel JFET designed to be operated as a detector in an X-ray spectrometer system. We estimate that a room temperature (300 K) JFET detector can be built with performance comparable to a small area, cryogenically cooled Si(Li) detector.

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References

REFERENCES

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