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Large Angle X-Ray Diffraction Study of Nanocrystalline Pd

Published online by Cambridge University Press:  28 February 2011

M. R. Fitzsimmons,
J. A. Eastman,
M. Müller-Stach and
G. Wallner
M. R. Fitzsimmons
Affiliation:
Sektion Physik der Universität München, München, FRGLos Alamos National Laboratory, LANSCE, Los Alamos, NM 87545.
J. A. Eastman
Affiliation:
Argonne National Laboratory, Materials Science Division, Argonne IL, USA
M. Müller-Stach
Affiliation:
Sektion Physik der Universität München, München, FRG
G. Wallner
Affiliation:
Sektion Physik der Universität München, München, FRG
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Abstract

Quantitative x-ray diffraction measurements of ultrafine-grained (nanocrystalline) Pd and a coarse-grained polycrystalline reference foil were obtained using synchrotron radiation. The Bragg reflection intensity profiles of nanocrystalline Pd were found to be considerably better represented by Lorentzian functions than by Gaussian functions, indicating that a large fraction of the intensity from the Bragg peaks is located in the tails of the reflections. The intensity that is in the Lorentzian-shaped Bragg peaks differs only slightly for different grain-sized materials; thus, the atomic relaxations in the vicinity of grain boundaries do not produce broadly distributed diffuse scattering other than that found in the Bragg reflections. The results of the present work do not support the previously proposed existence of either a “gas-like” grain boundary phase, or large quantities of vacancies or voids within grains of nanocrystalline Pd.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 206: Symposium G – Clusters and Cluster-Assembled Materials , 1990, 475
Copyright
Copyright © Materials Research Society 1991

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References

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