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Medium Range Order and 1/f Noise in Hydrogenated Silicon Thin Films

Published online by Cambridge University Press:  01 February 2011

T. J. Belich and
J. Kakalios
T. J. Belich
Affiliation:
School of Physics and Astronomy, University of Minnesota, Minneapolis, MN 55455
J. Kakalios
Affiliation:
School of Physics and Astronomy, University of Minnesota, Minneapolis, MN 55455
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Abstract

Measurements of the second spectra and correlation coefficients of conductance fluctuations are reported for a series of n-type doped a-Si:H films for which the deposition conditions are systematically varied. The non-Gaussian character of the 1/f noise is found to decrease with decreasing deposition temperature, which is also correlated with an increase in the difference between the conductivity and thermopower activation energies (the Q-function). The decrease in non-Gaussian statistics is interpreted as a decrease in the interactions between inhomogeneous current filaments due to increasing long-range disorder in the material.

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