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Metal Colloids in Oxides* *

Published online by Cambridge University Press:  21 February 2011

J. Narayan,
Y. Chen and
R. M. Moon
J. Narayan
Affiliation:
Solid State Division, Oak Ridqe National Laboratory, Oak Ridge, TN 37831
Y. Chen
Affiliation:
Solid State Division, Oak Ridqe National Laboratory, Oak Ridge, TN 37831
R. M. Moon
Affiliation:
Solid State Division, Oak Ridqe National Laboratory, Oak Ridge, TN 37831
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Abstract

A method, based upon subtractive coloration or high-temperature reduction, was developed to produce metal precipitates or colloids in oxides. The structure, symmetry, morphology and composition of precipitates were analyzed by analytical electron microscopy and neutron scattering technioues. In the MgO:Ni system, the colloids were coherent nickel precipitates having a fcc structure (a0 = 3.52 Å), and occasionally a bcc structure (a0 = 2.88 Å). The coherent precipitates were analyzed to have either <100>m,∣∣ <111>p or <l00>m ∣∣<100>p matrix-precipitate orientation relationship depending upon the high-temperature reduction treatment. The optical absorption spectra of these materials were characterized by broad optical bands centered near 2.2 and 5.0 eV. By changing the size distribution of the precipitates, it was possible to obtain optical spectra of these materials suited for solar selective absorber applications. The dislocations and sub-boundaries provided nucleation sites for the formation of precipitates, and decreased the temperature of reduction. By providing sources of dislocations, the precipitates enhance the ductility and inhibit the propagation of cracks.

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Footnotes

*

Research sponsored by the Division of Materials Sciences, U. S. Department of Energy under contract W-7405-eng-26 with Union Carbide Corporation.

References

REFERENCES

1. Sprackling, M. T., The Plastic Deformation of Simple Ionic Crystals, Academic Press, London (1976).Google Scholar
2. Narayan, J., Chen, Y., Moon, R. M. and Carpenter, R. W., Phil. Mag. (in press).Google Scholar
3. Narayan, J. and Chen, Y., Phil. Maq. (in press).Google Scholar
4. Becher, P., J. Am. Cer. Soc. 66, 485 (1983).Google Scholar
5. Hughes, A. E. and Jain, S. C., Adv. Phys. 28, 719 (1979).Google Scholar
6. Treilleux, M. and Chassange, G., J. Phys. Lett. (Paris) 40, L161 (1979).Google Scholar
7. Treilleux, M., Thevenard, P., Chassagne, G. and Hobbs, L. W., Phys. Stat. Sol. (a) 48, 425 (1978).Google Scholar
8. Narayan, J., Chen, Y., and Moon, R. M., Phys. Rev. Lett. 46, 1491 (1981);Google Scholar
8a Narayan, J. and Chen, Y., U.S. Patent 4,376,755 (1983).Google Scholar
9. Moon, R. M., Phys. Rev. 136, A195 (1964).Google Scholar
10. Mook, H., Phys. Rev. 148, 495 (1966).CrossRefGoogle Scholar
11. Craighead, H. G., Bartynski, R., Buhrman, R. A., Wojark, L. and Sievers, A. J., Solar Energy Materials 1, 105 (1979).Google Scholar
12. Abraham, M. M., Butler, C. T. and Chen, Y., J. Chem. Phys. 55, 3752 (1971).Google Scholar
13. Chen, Y., Narayan, J. and Tsang, K. L. (in preparation).Google Scholar
14. Steeds, J. W., p. 387 in Introduction to Analytical Electron Microscopy, ed. by Hren, J., Goldstein, J. and Jog, D., Plenum Press, New York (1979).Google Scholar
15. Carpenter, R. W. and Spence, J. C. H., Acta Cryst. A38, 55 (1982).CrossRefGoogle Scholar
16. Zaluzec, N. J., p. 121 in Introduction to Analytical Electron Microscopy, ed. by Hren, J., Goldstein, J. and Joy, D., Plenum Press, New York (1979).Google Scholar
17. Reppich, B. and Knock, H., p. 243 in Deformation of Ceramic Materials, ed. by Bradt, R. C. and Tressler, R. E., Plenum Press, New York (1975).CrossRefGoogle Scholar
18. Narayan, J. and White, C. W., Phil. Maq. 43, 1515 (1981).Google Scholar
19. Bullough, R. and Newman, R. C., Phil. Mag. 5, 92 (1960).Google Scholar
20. Freiman, S. W., Becher, P. F. and Klein, P. H., Phil. Mag. 31, 829 (1975).Google Scholar
21. Hing, P. and Groves, G. W., J. Mat. Sci. 7, 422 (1972).CrossRefGoogle Scholar
22. Gilman, J. J., J. Appl. Phys. 31, 2208 (1960)CrossRefGoogle Scholar