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Meyer-Neldel Rule in Deep-Level-Transient-Spectroscopy and its Ramifications

Published online by Cambridge University Press:  01 February 2011

Richard S. Crandall
Richard S. Crandall*
Affiliation:
National Renewable Energy Laboratory, Golden, Colorado 80401
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Abstract

This paper presents data showing a Meyer-Neldel rule (MNR) in InGaAsN alloys. It is shown that without this knowledge, significant errors will be made using Deep-Level Transient-Spectroscopy (DLTS) emission data to determine capture cross sections. By correctly accounting for the MNR in analyzing the DLTS data the correct value of the cross section is obtained.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 763: Symposium B – Compound Semiconductor Photovoltaics , 2003, B2.5
Copyright
Copyright © Materials Research Society 2003

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