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Micropillar Compression of MoSi2 Single Crystals

Published online by Cambridge University Press:  13 January 2015

Satoshi Nakatsuka,
Kyosuke Kishida and
Haruyuki Inui
Satoshi Nakatsuka
Affiliation:
Department of Materials Science and Engineering, Kyoto University Sakyo-ku, Kyoto 606-8501, Japan
Kyosuke Kishida
Affiliation:
Department of Materials Science and Engineering, Kyoto University Sakyo-ku, Kyoto 606-8501, Japan
Haruyuki Inui
Affiliation:
Department of Materials Science and Engineering, Kyoto University Sakyo-ku, Kyoto 606-8501, Japan
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Abstract

Deformation behavior of MoSi2 has been studied by micropillar compressions of single crystalline specimens prepared by focused ion beam (FIB) technique as a function of crystal orientation at room temperature. Activation of the {011}<100> and {01 $\overline 3$ }<331> slip systems were observed in the micropillars compressed along [ $\overline 1$ 10] and [0 15 1], respectively. The CRSS values for each slip system exhibit an approximate power law relationship with the edge length of micropillar. The {01 $\overline 3$ }<331> slip exhibit much stronger size-dependence than the {011}<100> slip system.

Keywords

stress/strain relationshipcompoundscanning electron microscopy (SEM)

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References

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