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Microstructural Analysis of Hexagonal Close-Packed Metals Using X-Ray Diffraction and Transmission Electron Microscopy

Published online by Cambridge University Press:  26 February 2011

M. Griffiths  and
J.E. Winegar
M. Griffiths
Affiliation:
AECL Research, Chalk River Laboratories, Chalk River, Ontario, Canada, KOJ 1JO.
J.E. Winegar
Affiliation:
AECL Research, Chalk River Laboratories, Chalk River, Ontario, Canada, KOJ 1JO.
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Abstract

The techniques employed for X-ray diffraction analysis of dislocation substructures in hexagonal close-packed metals are descibed and assessed by comparison with direct observations using transmission electron microscopy.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 209: Symposium K – Defects in Materials , 1990 , 83
Copyright
Copyright © Materials Research Society 1991

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References

REFERENCES

1. Williamson, G.K. and Smallman, R.E., Phil. Mag. 1, 34 (1956).Google Scholar
2. Wagner, C.N.L., Local Atomic Arrangements Studied by X-ray Diffraction, edited by Cohen, J.B. and Hilliard, J.E. (Gordon and Breach Science Publishers, New York, 1965), 36, p. 219.Google Scholar
3. Holt, R.A., J. Nucl. Mater. 59, 234 (1976).Google Scholar