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Microwave Imaging Techniques for Non-Destructive Testing of Materials

Published online by Cambridge University Press:  25 February 2011

J.Ch. Bolomey and
Ch. Pichot
J.Ch. Bolomey
Affiliation:
Groupe d'Electromagnétisme, Laboratoire des Signaux et Systèmes (CNRS/ESE) Ecole Supérieure d'Electricité, Plateau de Moulon, F 91192 Gif-sur-Yvette Cedex, France
Ch. Pichot
Affiliation:
Groupe d'Electromagnétisme, Laboratoire des Signaux et Systèmes (CNRS/ESE) Ecole Supérieure d'Electricité, Plateau de Moulon, F 91192 Gif-sur-Yvette Cedex, France
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Abstract

Recent technological advances for microwave multiport sensors lead us to look for efficient wavefront processing techniques in order to improve image quality, in terms of spatial resolution and contrast. This paper reviews some of these techniques which can be used for Non-Destructive Testing purposes. Mutual advantages and limitations are analysed.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 269: Symposium L – Microwave Processing of Materials III , 1992, 479
Copyright
Copyright © Materials Research Society 1992

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References

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