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Morphological changes of Branched Ge Clusters caused by Diffusion Fields and Surface Roughness of Au Underlayer

Published online by Cambridge University Press:  10 February 2011

A. Sugawara,
T. Kikukawa,
Y. Haga and
O. Nittono
A. Sugawara
Affiliation:
Department of Metallurgical Engineering, Tokyo Institute of Technology, Oh-okayama 2-12-1, Meguro-ku, Tokyo 152, Japan.
T. Kikukawa
Affiliation:
Department of Metallurgical Engineering, Tokyo Institute of Technology, Oh-okayama 2-12-1, Meguro-ku, Tokyo 152, Japan.
Y. Haga
Affiliation:
Department of Metallurgical Engineering, Tokyo Institute of Technology, Oh-okayama 2-12-1, Meguro-ku, Tokyo 152, Japan.
O. Nittono
Affiliation:
Department of Metallurgical Engineering, Tokyo Institute of Technology, Oh-okayama 2-12-1, Meguro-ku, Tokyo 152, Japan.
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Abstract

The formation of polycrystalline Ge clusters, during annealing of amorphous Ge/polycrystalline Au bilayers, has been studied by in-situ transmission and scanning electron microscopy. The experimentally observed generation of branching patterns, and the evolution mechanism of branches, are discussed on the basis of finite diffusion length aggregation simulations.

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References

REFERENCES

[1] Sugawara, A., Kikukawa, T. and Nittono, O., Mat. Sci. Eng., 179, 355, (1994).Google Scholar
[2] Hou, J. q. and Wu, Z. q., Phys. Rev., B40, 1008 (1989).Google Scholar
[3] Duan, J. Z. and Wu, Z. Q., Sol. Stat. Comm., 65, 7 (1988).Google Scholar
[4] Mullins, W. W. and Sekerka, R. F., J. Appl. Phys., 34,323 (1963).Google Scholar
[5] Ball, R. C. and Witten, T. A., Phys. Rev. A29, 2966, (1982)Google Scholar
[6] Sugawara, A., Kikukawa, T. and Nittono, O., Proceedings of 14th International Conference on Electron Microscopy (1994, Paris, France) p467.Google Scholar
[7] Smith, R. L. and Collons, R. D., Phys. Rev., A39, 5409, (1989)Google Scholar
[8] “Numerical Recipes in Pascal”, ed. Press, William H., Cambridge University Press, Cambridge, 1989.Google Scholar
[9] Family, F. and Vicsek, T., Computer Phys. p44(1990).Google Scholar
[10] Roder, H., Hahn, E., Brune, H., Bucher, J. P. and Kern, K., Nature, 366, 141, (1993).Google Scholar