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Open Applicator Analysis For Material Joining And Dielectric Measurements

Published online by Cambridge University Press:  10 February 2011

S. P. Chen,
W. R. Tinga and
F. E. Vermeulen
S. P. Chen
Affiliation:
E.E. Dept., University of Alberta, Edmonton, Alberta, Canada, T6G 2G7
W. R. Tinga
Affiliation:
E.E. Dept., University of Alberta, Edmonton, Alberta, Canada, T6G 2G7
F. E. Vermeulen
Affiliation:
E.E. Dept., University of Alberta, Edmonton, Alberta, Canada, T6G 2G7
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Abstract

Resonant internal and radiated external electromagnetic fields of an open coaxial structure are analyzed using FDTD. These fields are characterized for two structures, with and without a quarter-wave choke. Techniques utilized to obtain a steady state solution are discussed. Good agreement with field measurements is obtained. This moveable open applicator is convenient for creating intense hot zones as required in ceramic joining. It is also suitable for the measurement of surface dielectric properties of planar materials at room or elevated temperatures.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 430: Symposium O – Microwave Processing of Materials V , 1996, 295
Copyright
Copyright © Materials Research Society 1996

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References

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