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Plan-View Transmission Electron Microscopy Of Crack Tips In Bulk Materials

Published online by Cambridge University Press:  15 February 2011

H. Saka,
G. Nagaya,
T. Sakuishi,
S. Abe and
A. Muroga
H. Saka
Affiliation:
Department of Quantum Engineering, Nagoya University,Nagoya, 464–01, Japan
G. Nagaya
Affiliation:
Department of Quantum Engineering, Nagoya University,Nagoya, 464–01, Japan
T. Sakuishi
Affiliation:
Department of Quantum Engineering, Nagoya University,Nagoya, 464–01, Japan
S. Abe
Affiliation:
Department of Quantum Engineering, Nagoya University,Nagoya, 464–01, Japan
A. Muroga
Affiliation:
Aichi Steel Works Ltd., Tokai, 476, Japan
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Abstract

A focused ion beam (FIB) system has been applied to prepare a thin foil specimen of Si, MgO and alumina which contained cracks in the plane of foil. It was possible to observe a much larger area at and near a crack tip than has been hitherto possible. FIB was also applied to observation of microstructure near a crack tip evolved during severe rolling contact fatigue in a steel.

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