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Polycrystalline Diffraction and Synchrotron Radiation

Published online by Cambridge University Press:  21 February 2011

Michael Hart and
William Parrish
Michael Hart
Affiliation:
Department of Physics, Schuster Laboratory, The University, Manchester, M13 9PL, U.K.
William Parrish
Affiliation:
IBM Research, Almaden Research Center, 650, Harry Road, San Jose, California 95120-6099, U.S.A.
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Abstract

Synchrotron radiation sources allow a new generation of parallel beam instruments to be developed for polycrystalline xray diffraction. Spectroscopy can be combined with diffraction in either angle or energy scanning modes. The high intensity narrow instrument profile and freedom from aberrations make possible a wide range of measurements; of anomalous dispersion, of peak-shape analysis to determine particle size and strain, of preferred orientation and structure as a function of depth and of lattice parameters with a precision approaching 1 part per million. The parallel beam instrument which we have developed is now to be installed on a regular basis at SSRL and at Daresbury.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 143: Symposium V – Synchrotron Radiation in Materials Research , 1988, 185
Copyright
Copyright © Materials Research Society 1989

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