Hostname: page-component-7b7567c8c-7pwfn Total loading time: 0 Render date: 2026-11-15T20:42:21.131Z Has data issue: false hasContentIssue false

Protective Zirconia Thin Films on Metal Substrates.

Published online by Cambridge University Press:  25 February 2011

Andrea Tomasi
Affiliation:
Institute for Scientific and Technologic Research, Trento, Italy
Paolo Scardi
Affiliation:
Department of Materials Engineering, University of Trento, Trento, Italy.
Fabio Marchetti
Affiliation:
Institute for Scientific and Technologic Research, Trento, Italy
Get access

Abstract

Stabilized Zirconia thin films were deposited by R. F. Magnetron Sputtering onto iron substrates. Deposition parameters such as gas pressure and R. F. voltage were optimized to obtain homogeneous and well adherent protective coatings. The morphology and structure of films before and after thermal treatments were investigated by Scanning Electron Microscopy (SEM), X-Ray Diffraction (XRD) and Thermogravimetrical Analysis (TGA).

Auger Electron Spectroscopy (AES) depth profiling techniques were used to obtain the chemical distribution of the elements in order to study the influence of two important parameters on the adhesion of the ceramic: the presence of a thin layer of native metal oxide and the residual surface roughness after polishing.

The effectiveness of coatings to protect the metal substrate against high temperature oxidation in air was evaluated by thermogravimetrical analysis at 773K. The protective action of the ceramic film was well demonstrated.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable