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Recombination at Heterojunction Interfaces

Published online by Cambridge University Press:  22 February 2011

M. Müllenborn and
N. M. Haegel
M. Müllenborn
Affiliation:
Department of Materials Science & Engineering, University of California at Los Angeles, Los Angeles, CA 90024
N. M. Haegel
Affiliation:
Department of Materials Science & Engineering, University of California at Los Angeles, Los Angeles, CA 90024
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Abstract

Generation and recombination mechanisms at heterojunction interfaces are quantitatively discussed for lattice-matched (AlGaAs/GaAs) and lattice-mismatched (InGaAs/InP) systems. The effect of increased interface recombination on photon recycling and carrier diffusion through the interface region are estimated through a calculation based on the ambipolar diffusion equation. Experimental photoluminescence power dependencies, revealing information about generation and recombination mechanisms, fit well with calculated photoluminescence intensities. Lifetimes and interface extent can be determined by these fits.

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References

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