Hostname: page-component-7b7567c8c-2rsb6 Total loading time: 0 Render date: 2026-11-12T15:05:14.143Z Has data issue: false hasContentIssue false

Reliability Assurance for Thermo-Optic Solid State Optical Switches

Published online by Cambridge University Press:  10 February 2011

P. M. C. De Dobbelaere
Affiliation:
Akzo Nobel Electronic Products Inc., Sunnyvale, CA94089, peter.dd@akzo-nobel.com
P. J. Van Der Wel
Affiliation:
Akzo Nobel Photonics, PO Box 9300, 6800SB, Arnhem, The Netherlands, paul.van.der.wel@arnhem.akzonobel.nl
B. Hendriksen
Affiliation:
Akzo Nobel Photonics, PO Box 9300, 6800SB, Arnhem, The Netherlands, paul.van.der.wel@arnhem.akzonobel.nl
M. C. Flipse
Affiliation:
Akzo Nobel Photonics, PO Box 9300, 6800SB, Arnhem, The Netherlands, paul.van.der.wel@arnhem.akzonobel.nl
J. Thackara
Affiliation:
Akzo Nobel Electronic Products Inc., Sunnyvale, CA94089, peter.dd@akzo-nobel.com
N. Zhu
Affiliation:
Akzo Nobel Electronic Products Inc., Sunnyvale, CA94089, peter.dd@akzo-nobel.com
J. Freeman
Affiliation:
Akzo Nobel Electronic Products Inc., Sunnyvale, CA94089, peter.dd@akzo-nobel.com
Get access

Abstract

The reliability assurance program for the BeamBoxTM thermo-optic solid state optical switches is presented. The different phases of the program are discussed, and some of the results are described.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable