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Scaling Behavior Near Superconducting Transition in the YBa2Cu3O7 System

Published online by Cambridge University Press:  26 February 2011

M. K. Wu,
M. J. Wang,
Y. C. Chen,
T. R. Chien,
C. C. Chi and
F. Holtzberg
M. K. Wu
Affiliation:
Department of Physics and Materials Science Center, National Tsing-Hua University, Taiwan, ROC
M. J. Wang
Affiliation:
Department of Physics and Materials Science Center, National Tsing-Hua University, Taiwan, ROC
Y. C. Chen
Affiliation:
Department of Physics and Materials Science Center, National Tsing-Hua University, Taiwan, ROC
T. R. Chien
Affiliation:
Department of Physics and Materials Science Center, National Tsing-Hua University, Taiwan, ROC
C. C. Chi
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, NY
F. Holtzberg
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, NY
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Abstract

We have carried out a systematic study of the detailed I-V characteristic in magnetic fields of the YBa2Cu3O7 (YBCO) single crystals and c-axis oriented thin films. For all the samples studied, there exists a temperature at which the I-V satisfies simple power law. The I-V characteristic also follows the scaling behavior predicted by the phase transition model based on the random disorder. The derived critical exponents suggest the occurrence of 3D to 2D crossover of the flux motion. The critical field at which the crossover occurs depends on the sample thickness.

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References

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