Hostname: page-component-7b7567c8c-2rsb6 Total loading time: 0 Render date: 2026-11-12T09:07:22.882Z Has data issue: false hasContentIssue false

Silicon Nanoparticle Synthesis Using Constricted Mode Capacitive Silane Plasma

Published online by Cambridge University Press:  21 March 2011

A. Bapat
Affiliation:
Depatment of Mechanical Engineering The University of Minnesota, Minneapolis, MN 55455, USA
Ying Dong
Affiliation:
Department of Electrical and Computer Engineering The University of Minnesota, Minneapolis, MN 55455, USA
C. R. Perrey
Affiliation:
Department of Chemical Engineering and Materials Science The University of Minnesota, Minneapolis, MN 55455, USA
C. B. Carter
Affiliation:
Department of Chemical Engineering and Materials Science The University of Minnesota, Minneapolis, MN 55455, USA
S.A. Campbell
Affiliation:
Department of Electrical and Computer Engineering The University of Minnesota, Minneapolis, MN 55455, USA
U. Kortshagen
Affiliation:
Depatment of Mechanical Engineering The University of Minnesota, Minneapolis, MN 55455, USA
Get access

Abstract

Crystalline semiconductor nanoparticles are of interest for a variety of electronic and opto-electronic applications. We report experimental studies of the synthesis and characterization of crystalline silicon nanoparticles using a constricted-mode capacitive RF plasma in continua- tion of results reported earlier from an RF inductively coupled plasma [1]. The constricted-mode discharge is based on a thermal plasma instability yielding a high-density plasma filament, which rotates at a high frequency. Silane is dissociated, leading to particle nucleation and growth. Particles are extracted by passing the particle-laden gas through an orifice to form a beam and col- lected by inertial impaction.

We are able to reproducibly synthesize highly oriented freestanding single-crystal silicon nanoparticles. Monodisperse particle size distributions centered at a 35nm particle diameter with a geometric standard deviation of 1.3 are obtained. Transmission electron microscope (TEM) studies show uniformly shaped cubic particles. Selected-area electron diffraction patterns indi- cate the particles have the diamond-cubic silicon structure. To study the electrical properties of these particles, metal-semiconductor-metal structures were fabricated and analyzed.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable