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Sliding Friction by Atomic Force Microscopy

Published online by Cambridge University Press:  10 February 2011

V. Pasquier and
J. M. Drake
V. Pasquier
Affiliation:
Exxon Research and Engineering Co., Route 22 East, Annandale, NJ 08801, vpasqui@erenj.com
J. M. Drake
Affiliation:
Exxon Research and Engineering Co., Route 22 East, Annandale, NJ 08801, vpasqui@erenj.com
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Abstract

Lateral Force Microscopy offers the possibility of exploring tribological properties of interfaces atthe nanoscale. Our research focused on some crucial conditions that must be fuffilled to obtainquantitative and reliable LFM friction measurements. We have characterized the mechanical andvibrational properties of the cantilever. Precise force calibration were made based on ourknowledge of the intrinsic coupling modes of the cantilever. We report measurements of the slidingfriction between two silica surfaces. The load dependence of the friction force was analyzedassuming different models for the contact, from Hertzian to Amontons law.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 543: Symposium W – Dynamics in Small Confining Systems IV , 1998, 51
Copyright
Copyright © Materials Research Society 1999

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