Hostname: page-component-7b7567c8c-tnzcf Total loading time: 0 Render date: 2026-11-15T00:32:24.342Z Has data issue: false hasContentIssue false
  • English
  • Français

Stem Probe Spreading

Published online by Cambridge University Press:  25 February 2011

L. D. Marks
L. D. Marks*
Affiliation:
Department of Pnysics, Arizona State University, Tempe, AZ 85287
Get access

Abstract

The theoretical ideas for STEM probe spreading using spherical wave X-ray diffraction theory and expel imental results of diffractive probe spreading are briefly described. Clear evidence is found for two beam Bormann fan effects arising from nigh order diffracted beams.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Goldstein, J. I., Costley, J. L., Lorimer, G. W. and Reed, S. J., SEM/1977, Ed. Johari, O. (IITRI, Chicago, IL) 315.Google Scholar
2. Faulkner, R. G. and Norgaard, K., X-ray Spectrometry 7, 181 (1978).10.1002/xrs.1300070403Google Scholar
3. Doing, P., Lonsdale, D. and Flewitt, P.E.J., Phil. Mag. A 41, 761 (1980).Google Scholar
4. Rez, P., Ultramicroscopy 12, 29 (1983).10.1016/0304-3991(83)90302-9CrossRefGoogle Scholar
5. Azaroff, L. V., Kaplow, R., Kate, N., Weiss, R.L., Wilson, A.J.C. and Young, R.A., X-ray Diffraction (McGraw-Hill, New York, 1974).Google Scholar
6. Hart, M., in Characterisation of Crystal Growth Defects by X-ray Methods, Ed. Tanner and Bowen (Plenum Press, New York, (1980) p. 216.10.1007/978-1-4757-1126-4_9Google Scholar
7. Kato, N., , in Characterisation of Crystal Growth Defects by X-ray Methods, Ed. Tanner and Bowen (Plenum Press, New York, (1980) p. 264.10.1007/978-1-4757-1126-4_10Google Scholar
8. Pinsker, Z. G., Dynamical Scattering of X-rays in Crystals (Springer-Verlag, New York, 1978).10.1007/978-3-642-81207-1Google Scholar
9. Marks, L. D., in Proceedings Eight European Congress on Electron Microscopy EDS Csanady, Rohlich and Szabo, p. 137, 1984.Google Scholar
10. Marks, L. D., submitted to Ultramicroscopy, 1984.Google Scholar
11. Kate, N., Acta. Cryst. A 24, 157 (1968).10.1107/S0567739468000203CrossRefGoogle Scholar
12. Kato, N., Acta. Cryst. 14 526 (1961) and 14 627 (1961).10.1107/S0365110X61001625Google Scholar
13. Kate, N. and Lang, A.R., Acta Cryst. 12, 787 (1959).10.1107/S0365110X59002262Google Scholar
14. Howie, A., Proc. Roy. Soc. A 271, 268 (1963).Google Scholar