Hostname: page-component-7b7567c8c-7pwfn Total loading time: 0 Render date: 2026-11-15T17:05:52.185Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural Characterisation of Fe-Cu Multilayers of Differing Fe Thicknesses Using Transmission Electron Microscopy

Published online by Cambridge University Press:  15 February 2011

S. J. Lloyd,
R. E. Somekh and
W. M. Stobbs
S. J. Lloyd
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St. Cambridge CB2 3QZ, U.K.
R. E. Somekh
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St. Cambridge CB2 3QZ, U.K.
W. M. Stobbs
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke St. Cambridge CB2 3QZ, U.K.
Get access

Abstract

In-plane and out-of-plane lattice parameters were measured in a series of coherent Fe-Cu multilayers using non-axial high resolution electron microscopy (HREM). The results indicate that the multilayers are tetragonally distorted with the magnitude of the distortion varying with the thickness of the Fe component. These distortions preclude an understanding of the multilayer structure in terms of conventional elasticity theory. The breakdown of epitaxy for thicker Fe layers was also investigated and it was found that the b.c.c. Fe grew with [110] parallel to [001] of the coherent f.c.c. multilayer.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

1. Baxter, C.S. and Stobbs, W.M., Nature 322, 814 (1986)Google Scholar
2. Moruzzi, V.L., Marcus, P.M. and Küler, J., Phys. Rev. B39, 6957 (1989)Google Scholar
3. Lloyd, S.J., Somekh, R.E., Dunin-Borkowski, R.E. and Stobbs, W.M. in Fractal Aspects of Materials (Mater. Res. Soc. Proc., 367,1994) (in press)Google Scholar
4. Somekh, R.E. and Baxter, C.S., J. Crystal Growth, 76, 119 (1986)Google Scholar
5. Lu, S.H., Quinn, J., Tian, D., and Jona, F., Surface Science, 209, 364 (1989)Google Scholar
6. Pitsch, W., Phil. Mag. 4, 577 (1959)Google Scholar
7. Schmailzl, P., Schmidt, K., Bayer, P., Döll, R., and Heinz, K., Surf. Sci, 312, 73 (1994)Google Scholar
8. Kalki, K., Chambliss, D.D., Johnson, K.E., Wilson, R.J., and Chiang, S., Phys. Rev. B48, 18344 (1993)Google Scholar
9. Wuttig, M., Feldmann, B., Thomassen, J., May, F., Zillgen, H., Brodde, A., Hannemann, H. and Neddermeyer, H., Surf. Sci., 291, 14 (1993)Google Scholar
10. Chambliss, D.D., Johnson, K.E., Kalki, K., Chiang, S. and Wilson, R.J.. in Magnetic Ultrathin Films (Mater. Res. Soc. Proc. 313, 1993) pp. 713–722 Google Scholar
11. Soylu, B., Somekh, R.E., and Stobbs, W.M., EUROMAT 89, Advanced Materials and Processes (Ed. Exner, H.E., Schumacher, V.), 2, 1019, (1990)Google Scholar
12. Hall, D.J., Self, P.G. and Stobbs, W.M., J. Microsc. 130, 215 (1983)Google Scholar
13. Treacy, M.M.J., Gibson, J.M. and Howie, A., Phil. Mag. A, 51, 389 (1985)Google Scholar
14. Clarke, A., Rous, P.J., Arnott, M., Jennings, G. and Willis, R.F., Surf. Sci., 192, L843 (1987)Google Scholar
15. Müller, S., Bayer, P., Reischl, C., Heinz, K., Feldmann, B., Zillgen, H. and Wuttig, M., Phys. Rev. Lett., 74, 765 (1995)Google Scholar
16. Lloyd, S.J., Botton, G.A. and Stobbs, W.M., submitted to J. Microscopy (1995)Google Scholar