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Structure Imaging and Defects in Crystallized Oxynitride Glasses

Published online by Cambridge University Press:  26 February 2011

R.S. Rai,
M.A. O'Keefe and
G. Thomas
M.A. O'Keefe
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720
G. Thomas
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720
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Abstract

High resolution electron microscopy has been employed to elucidate fault defects and structural details of the δ1 and δ2 -Y 2Si2O7 crystalline phases. From this study δ1 and δ2 -Y 2Si2O7 have been found to be orthorhombic having the same cell parameters but different atomic arrangements due to a change in their space groups. Computer simulations were necessary for interpreting details from the high resolution electron micrographs.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 82: Symposium I – Characterization of Defects in Materials , 1986, 429
Copyright
Copyright © Materials Research Society 1987

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References

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