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A Study of Grain Boundaries in High TC Superconducting Yba2Cu3O7-x Thin Films Using High Resolution Analytical Stem

Published online by Cambridge University Press:  28 February 2011

D. H. Shin,
J. Silcox,
S. E. Russek,
D. K. Lathrop and
R. A. Buhrman
D. H. Shin
Affiliation:
School of Applied And Engineering Physics, Cornell University Ithaca, New York 14853
J. Silcox
Affiliation:
School of Applied And Engineering Physics, Cornell University Ithaca, New York 14853
S. E. Russek
Affiliation:
School of Applied And Engineering Physics, Cornell University Ithaca, New York 14853
D. K. Lathrop
Affiliation:
School of Applied And Engineering Physics, Cornell University Ithaca, New York 14853
R. A. Buhrman
Affiliation:
School of Applied And Engineering Physics, Cornell University Ithaca, New York 14853
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Abstract

Grain boundaries in thin films of high Tc YBa2Cu3O7-x superconductors have been investigated with high resolution scanning transmission electron microscope (STEM) imaging and nanoprobe energy dispersive x-ray (EDX) analysis. Atomic resolution images indicate that the grain boundaries are mostly clean, i.e., free of a boundary layer of different phase or of segregation, and are often coherent. EDX microanalysis with a 10 Å spatial resolution also indicates no composition deviation at the grain boundaries.

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