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Superconducting Multilayers: Microstructural Properties Studied by X-Ray Diffraction

Published online by Cambridge University Press:  15 February 2011

A. Vailionis,
A. Brazdeikis and
A.S. FlodstrÖm
A. Vailionis
Affiliation:
Dept. of Physics, Materials Physics, Royal Institute of Technology, S-100 44 Stockholm, Sweden
A. Brazdeikis
Affiliation:
Dept. of Physics, Materials Physics, Royal Institute of Technology, S-100 44 Stockholm, Sweden
A.S. FlodstrÖm
Affiliation:
Dept. of Physics, Materials Physics, Royal Institute of Technology, S-100 44 Stockholm, Sweden
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Abstract

Structural properties of molecular beam epitaxy-grown Bi2Sr2Cu1Oy'Bi2Sr2Ca1Cu2Oy multilayers have been studied by x-ray diffraction. A one-dimensional kinematic x-ray diffraction model has been used to describe the structural quality of the multilayers. Interface roughness, stacking defects and unit cell disorder are obtained by an iterative fitting of the calculated diffraction profile to the experimental spectra. The type and amount of disorder in the films was qualitatively determined. Results demonstrate that structural imperfections are present in the multilayers and have to be considered when transport properties are studied.

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References

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