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Surface Potential Mapping of Patterned Self-Assembled Monolayers by Scanning Probe Microscopy

Published online by Cambridge University Press:  01 February 2011

R. Ross Getty,
Rodolfo Alvarez,
Dawn A. Bonnell,
Kenneth G. Sharp,
Simona Percec and
Paula B. Hietpas
R. Ross Getty
Affiliation:
DuPont Central Research & Development, Experimental Station, Wilmington, DE, USA.
Rodolfo Alvarez
Affiliation:
Dept. of Materials Science & Engineering, University of Pennsylvania, Philadelphia, PA, USA
Dawn A. Bonnell
Affiliation:
Dept. of Materials Science & Engineering, University of Pennsylvania, Philadelphia, PA, USA
Kenneth G. Sharp
Affiliation:
DuPont Central Research & Development, Experimental Station, Wilmington, DE, USA.
Simona Percec
Affiliation:
DuPont Central Research & Development, Experimental Station, Wilmington, DE, USA.
Paula B. Hietpas
Affiliation:
DuPont Central Research & Development, Experimental Station, Wilmington, DE, USA.
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Abstract

Surface potentials of a number of patterned conducting and insulating self-assembled monolayers (SAMs) were measured by scanning surface potential microscopy (SSPM) as part of a study in molecular electronics. Differences in surface potential were measured for insulating and conducting molecule SAMs on gold. The SAMs were patterned by microcontact printing. High contrast patterns were observed by surface potential even when little imaging was possible in standard AFM modes. Surface potential differences of a few mV to 500 mV were observed under ambient conditions between adjacent SAMs of different compositions or between SAMs and the unmodified substrate.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 727: Symposium R – Nanostructured Interfaces , 2002, R11.9
Copyright
Copyright © Materials Research Society 2002

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