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A Survey of Diverse Approximations for Microstructural Characterization using Powder Diffraction Data: β-Ni(OH)2, a Case Study

Published online by Cambridge University Press:  26 February 2011

Monste Casas-Cabanas,
Juan Rodriguez-Carvajal,
Judith Oro-Sole and
M. Rosa Palacin
Monste Casas-Cabanas
Affiliation:
casas@icmab.es, ICMAB-CSIC, Solid State Chemistry, Institut de Ciència de Materials de Barcelona, Campus UAB, Bellaterra, 08193, Spain
Juan Rodriguez-Carvajal
Affiliation:
jrc@ill.fr, Institut Laue-Languevin (ILL), 6, rue Jules Horowitz, Grenoble, BP 156 - 38042, France
Judith Oro-Sole
Affiliation:
oro@icmab.es, Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, Bellaterra, 08193, Spain
M. Rosa Palacin
Affiliation:
rosa.palacin@icmab.es, Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, Bellaterra, 08193, Spain
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Abstract

The microstructural features of diverse samples are studied by powder X-ray diffraction using different methods for the analysis of the diffraction peak broadening. The results obtained are thoroughly analyzed taking into account the assumptions and simplifications done in each of the chosen methods (Scherrer, Stokes and Wilson, Williamson-Hall and Rietveld refinement) and direct observation of the studied specimens by transmission electron microscopy is used in order to contrast the results obtained. Classic simple methods that consider only size effects (Scherrer, Stokes and Wilson) or the combined effects of size and strains (Williamson-Hall) provide a rapid overview of the origins of line-broadening but the most reliable results are obtained when the whole diffraction pattern is taken into account (Rietveld refinement).

Keywords

microstructurex-ray diffraction (XRD)energy-storage

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 972: Symposium AA – Solid-State Ionics—2006 , 2006, 0972-AA13-01
Copyright
Copyright © Materials Research Society 2007

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