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Techniques for Investigating Structure and Composition with High Spatial Resolution

Published online by Cambridge University Press:  15 February 2011

John B. Vander Sande
John B. Vander Sande*
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge,MA 02139.
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Abstract

The techniques of scanning transmission electron microscopy and field iron microscopy/atom probe are briefly described. The advantages of these techniques for high spatial resolution compositional analysis are discussed and examples cited.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 8 , 1981 , 153
Copyright
Copyright © Materials Research Society 1982

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References

REFERENCES

1.Cliff, G. and Lorimer, G. W., J. of Micros. 103, 203 (1975).Google Scholar
2.Goldstein, J. I., Introduction to Analytical Electron Microscopy (eds. Hren, J. J., Goldstein, J. I. and Joy, D. C.), Plenum Press 1979.Google Scholar
3.Miller, M. K., Beaven, P. A. and Smith, G. D. W.. Surface and Interface Analysis, 1979, 1, 149.10.1002/sia.740010504Google Scholar
4.Kelly, T. F., Vander Sande, J. B. and Cohen, M., these proceedings.Google Scholar