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Texture by the kilometer

Published online by Cambridge University Press:  18 March 2011

E. D. Specht and
F. A. List
E. D. Specht
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory Oak Ridge, TN 37831-6118
F. A. List
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory Oak Ridge, TN 37831-6118
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Abstract

A novel x-ray diffractometer has been used to characterize the texture of 2 km of textured tape in segments up to 20 m long. Techniques have been developed for the study of the uniformity of texture and for the detection of second phases, deviations from cube texture, and the sharpness of cube texture, in metal substrates, oxide buffer layers, and YBa2Cu3O7 (YBCO) superconductors.

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References

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