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Tip-Sample Forces in Atomic Force Microscopy: Interplay between Theory and Experiment

Published online by Cambridge University Press:  15 May 2013

Sergey Belikov ,
John Alexander ,
Craig Wall  and
Sergei Magonov
Sergey Belikov
Affiliation:
NT-MDT Development Inc., 430 W. Warner Road, Tempe, AZ 85284, U.S.A.
John Alexander
Affiliation:
NT-MDT Development Inc., 430 W. Warner Road, Tempe, AZ 85284, U.S.A.
Craig Wall
Affiliation:
NT-MDT Development Inc., 430 W. Warner Road, Tempe, AZ 85284, U.S.A.
Sergei Magonov
Affiliation:
NT-MDT Development Inc., 430 W. Warner Road, Tempe, AZ 85284, U.S.A.
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Abstract

Several examples of Atomic Force Microscopy imaging in the oscillatory resonant and non-resonant modes are analyzed with a theoretical description of tip-sample force interactions. The problems of high-resolution imaging and compositional mapping of heterogeneous polymers are considered. The interplay with theory helps the experiment optimization and rational understanding of the image contrast.

Keywords

scanning probe microscopy (SPM)simulationpolymer

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Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1527: Symposium UU – Scanning Probe Microscopy―Frontiers in Nanotechnology , 2013 , mrsf12-1527-uu02-04
Copyright
Copyright © Materials Research Society 2013 

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References

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