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The use of Electron Microscopy and Electron Diffraction in the Study of Phase Transformations

Published online by Cambridge University Press:  21 February 2011

S. Amelinckx,
G. Van Tendeloo and
J. Van Landuyt
S. Amelinckx
Affiliation:
University of Antwerp (RUCA) Groenenborgerlaan 171, B 2020-Antwerp, Belgium;Also at S.C.K., B 2400-MOL, Belgium
G. Van Tendeloo
Affiliation:
University of Antwerp (RUCA) Groenenborgerlaan 171, B 2020-Antwerp, Belgium;
J. Van Landuyt
Affiliation:
University of Antwerp (RUCA) Groenenborgerlaan 171, B 2020-Antwerp, Belgium;
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Extract

In recent years a separate branch of electron microscopy, which can conveniently be termed “Solid State Electron Microscopy” has evolved into a discipline of its own, which makes use of a set of techniques such as

- diffraction contrast electron microscopy

- high resolution transmission electron microscopy

- selected area electron diffraction

- convergent beam electron diffraction

- optical diffraction of high resolution electron micrographs

and which allows to provide information on a wide variety of solid state phenomena. With the availability of microscopes with a resolution equal to interatomic distances its field of application has recently been extended greatly.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 21: Symposium GREECE – Phase Transformations in Solids , 1983, 85
Copyright
Copyright © Materials Research Society 1984

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References

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