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X-Ray Diffraction analysis of Au/Ni Multilayers

Published online by Cambridge University Press:  21 February 2011

J. Chaudhuri,
S. Shah and
A. F. Jankowski
J. Chaudhuri
Affiliation:
The Wichita State University, Wichita, KS 67208
S. Shah
Affiliation:
The Wichita State University, Wichita, KS 67208
A. F. Jankowski
Affiliation:
Lawrence Livermore National Laboratory, Livermore, CA 94550
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Abstract

X-ray diffraction is a useful method to measure the microscopic strain profile in multilayered materials. Depth profiles of strain in the modulation direction are obtained by an iterative fitting of the experimental diffraction pattern with a kinematic model. This approach was used to characterize the coherency strain profile in Au/Ni superlattices.

The accommodation of coherency strain through the superlattice is dependent upon the atomic misfit between the component materials and the thickness of each layer. The depth profile of strain was determined for multilayers with repeat periodicities of 2.92 nm and 4.26 nm. A significant volume fraction of interfaces is present in these nanometric dimensioned laminates.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 132: Symposium G – Multicomponent Ultrafine Microstructures , 1988, 231
Copyright
Copyright © Materials Research Society 1989

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References

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